The following email has been sent to LEE, Daehee:

===

Dear Daehee Lee,

The submission of your abstract has been successfully processed.

Abstract submitted: https://indico.cern.ch/userAbstracts.py?confId=192695.

Status of your abstract: https://indico.cern.ch/abstractDisplay.py?abstractId=182&confId=192695.

See below a detailed summary of your submitted abstract:

Conference: Tipp 2014 - Third International Conference on Technology and Instrumentation in Particle Physics

Submitted by: LEE, Daehee

Submitted on: 03 February 2014 04:11

Title: A radiation hardness CMOS layout by only changing procedure of a layer

Abstract content The impact from radiation to complementary metal-oxide semiconductor (CMOS) circuit which is used as read out circuit for high energy experiments or space satellite has been categorized into two problems: Total ionizing dose (TID) reflecting the long-period-time effects exists and the other is the single event effects (SEE) characterizing short time result. TID effect makes threshold voltages shifted and leakage current of NMOS transistors in CMOS device increase, especially. Thus, a number of layout methods are implemented. For example, enclosed layout transistor (ELT) has radiation hardness against TID effects while it has large implementation area, complicated effective W/L ratio, and asymmetric source and drain capacitance. It makes circuit design difficult. Other technique except ELT needs additional layer to exploit or careful design to eliminate short problem by silicide process. However, we presented simple and powerful radiation hardness layout method which needs only layer procedure change. It has been implemented using 0.18 m CMOS process. Traditional NMOS, proposed NMOS, and ELT will be tested by using Co-60 gamma ray source up to 30 Mrad and compared about leakage current, noise at input gate, and threshold voltage shift.

Summary

Primary Authors: Mr. LEE, Daehee (KAIST) zzzeogml@kaist.ac.kr

Co-authors: Mr. KANG, Dong-uk (KAIST) dukang@kaist.ac.kr Mr. PARK, Kyeongjin (KAIST) myesens@naver.com Mr. KIM, Myoung Soo (KAIST) mykingdomi@naver.com Mr. CHO, Minsik (KAIST) cms8564@gmail.com Mr. KIM, Jong Yul (KAIST) kjongyul@kaist.ac.kr Mr. KIM, Yewon (KAIST) yewonkim@kaist.ac.kr Mr. HEO, Jaewon (KAIST) jay1@kaist.ac.kr Mr. LIM, Kyung Teak (KAIST) kl2548@kaist.ac.kr Dr. KIM, Hyunduk (KAIST) fororigin@gmail.com Prof. CHO, Gyuseoung (KAIST) gscho@kaist.ac.kr

Abstract presenters: Mr. LEE, Daehee

Track classification: Sensors: 1b) Semiconductor Detectors Experiments: 2b) Astrophysics and Space Instrumentation

Presentation type: --not specified--

Comments: